دانشگاه آزاد اسلامی واحد علوم و تحقیقات

 آمار

تعداد نشریات50
تعداد شماره‌ها2,232
تعداد مقالات20,475
تعداد مشاهده مقاله25,226,692
تعداد دریافت فایل اصل مقاله22,857,965
Heidarnia, Ali, Ghomi, Hamid. (1401). Microstructure evolution in zirconium carbide thin films at different substrate temperatures. , 16(2), 1-6. doi: 10.30495/jtap.162217
Ali Heidarnia; Hamid Ghomi. "Microstructure evolution in zirconium carbide thin films at different substrate temperatures". , 16, 2, 1401, 1-6. doi: 10.30495/jtap.162217
Heidarnia, Ali, Ghomi, Hamid. (1401). 'Microstructure evolution in zirconium carbide thin films at different substrate temperatures', , 16(2), pp. 1-6. doi: 10.30495/jtap.162217
Heidarnia, Ali, Ghomi, Hamid. Microstructure evolution in zirconium carbide thin films at different substrate temperatures. , 1401; 16(2): 1-6. doi: 10.30495/jtap.162217

Microstructure evolution in zirconium carbide thin films at different substrate temperatures

Journal of Theoretical and Applied Physics
دوره 16، شماره 2، شهریور 2022، صفحه 1-6  XML اصل مقاله (1.78 M)
نوع مقاله: Scientific Research Manuscript
شناسه دیجیتال (DOI): 10.30495/jtap.162217
نویسندگان
Ali Heidarniaorcid 1؛ Hamid Ghomi email orcid 2
1Laser and Plasma Research Institute, Shahid Beheshti university
2Laser and Plasma Research Institute, Shahid Beheshti University
چکیده
Zirconium carbide (ZrC) is promising candidate materials in advanced nuclear reactors as fuel cladding and plasma facing materials. It can employ to increase ductility and fracture toughness of tungsten as prominent candidate of plasma facing materials in ITER and DEMO future fusion reactors. In this study, ZrC thin films were deposited through DC magnetron sputtering at different substrate temperatures. Argon and acetylene are respectively employed as the sputtering gas and reaction gas to produce ZrC from a Zr target. The phase and structure, crystallite size, displacement density, microstrain, and lattice's constant of the produced thin films were determined using X-ray diffraction (XRD) analysis. Raman spectroscopy was also used to identify various structures and chemical bonds. Furthermore, the analysis of Raman peaks associated with amorphous carbon bonds revealed that the ratio of sp3/sp2 carbon bonds increases by increasing temperature from 100°C to 180°C, which substantially affects the hardness of the thin films. Field Emission Scanning electron microscopy (FESEM) was used to measure the cross-sectional area and thickness of the thin films, and it was discovered that increasing temperature enhances the thickness of the thin films. The elemental analysis of ZrC thin films that was performed using X-ray energy dispersive spectroscopy (EDS) demonstrated the atoms that constitute the thin film, and their changes with temperature variations.
کلیدواژه‌ها
Microstructure؛ Zirconium carbide؛ Thin film deposition؛ Substrate temperature؛ Plasma facing materials
آمار
تعداد مشاهده مقاله: 134
تعداد دریافت فایل اصل مقاله: 154


سامانه مدیریت نشریات علمی. قدرت گرفته از سیناوب